convanit

convanit
Menü
Yield und Datenanalyse

convanitYield und Datenanalyse

    • DE
    • EN
  • Software
  • Consulting
  • References
  • Partner
  • Contact
  • Imprint
convanit

Applications for machine learning and Artifical Intelligence

What we mean

Together with you we define if your use cases are suitable for the application of machine learning and artificial intelligence. Typical examples in manufacturing control are automated classification of defect images and wafer signatures, detection of anomalies and discovery of connections between production related data like material-, quality-, sensor-, tool-, tracking data.

How we do it

In workshops we discuss with your process experts and technologists the possible use cases. With our team we develop, test and verify the necessary algorithms and prototypes of the applications. After a successful proof of concept phase the applications are ready for implementation.

  • Yield/Quality
  • Consulting
  • Data Integration
  • Implementation
  • Organization
  • Data Analytics
  • AI Applications
  • Software Solutions
  • Unkategorisiert
    • yield and reliability improvement
    • defect engineering
    • process control methodology
    • toolmonitoring
    • workshops
    • moderation
    • requirement analysis
    • project management
      • application support
      • maintenance support
      • implementation & deployment support
        • yield correlation and prediction, other methods
        • data analysis and reporting application
        • data modeling
        • anomaly and outlier detection
        • data analysis and reporting application
        • image classification
        • anomaly & outlier detection
        • defect localization
        • machine learning supported labeling
        • automated quality control
        • c-Alice – our AI supported automated image classification solution for the industry
        • customized interactive dashboard

      Competencies and Keywords

      Overview

      convanit

      Beratung zu Yield und Datenanalyse

      Impressum und Datenschutz

      Kontakt